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Influence of massive projectile size and energy on secondary ion yields from organic surfaces

  • Published:2006-07 Issue:19 Volume:252 Page:6529-6532
  • ISSN:0169-4332
  • Container-title:Applied Surface Science
  • language:en
  • Short-container-title:Applied Surface Science

Author:

Guillermier C.,Negra S. Della,Rickman R.D.,Pinnick V.,Schweikert E.A.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

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2. Applications of ToF-SIMS for imaging and depth profiling commercial materials;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2016-05

3. Surface Analysis of Organic Materials with Polyatomic Primary Ion Sources;Cluster Secondary Ion Mass Spectrometry;2013-04-15

4. SIMS for Organic Film Analysis;Mass Spectrometry Handbook;2012-05-21

5. Surface characterization of biological nanodomains using NP-ToF-SIMS;Surface and Interface Analysis;2012-02-28
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