SIMS analysis of nitrogen in various metals and ZnO

Author:

Li Yupu,Wang Shaw,Smith Stephen P.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference9 articles.

1. Room-Temperature Ultraviolet Nanowire Nanolasers

2. Does Advanced Technology Really Matter, Intel 2002 Annual Report, http://www.intel.com.

3. See Table B3 in

4. Secondary Ion Mass Spectrometry: A practical Handbook for Depth Profiling and Bulk Impurity Analysis;Wilson,1989

5. Investigation of buried AlN layers formed by nitrogen implantation into Al

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