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Development of a ToF version of the desktop MiniSIMS utilising a continuous primary ion beam

  • Published:2006-07 Issue:19 Volume:252 Page:7308-7311
  • ISSN:0169-4332
  • Container-title:Applied Surface Science
  • language:en
  • Short-container-title:Applied Surface Science

Author:

Eccles A.J.,Vohralik P.,Cliff B.,Jones C.,Long N.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference10 articles.

1. A time-of-flight mass spectrometer for measurement of secondary ion mass spectra

2. Ion formation from organic solids,1983

3. ToF mass analysers;Schueler,2001

4. Primary ion beam systems;Hill,2001

5. Technical Note on Patented Burst Mode IonTOF GmbH, 2005.

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1. High spatial resolution and high brightness ion beam probe for in-situ elemental and isotopic analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-03

2. Postacquisition Mass Resolution Improvement in Time-of-Flight Secondary Ion Mass Spectrometry;Analytical Chemistry;2012-01-25

3. Surface interactions and tribochemistry in boundary lubrication of hypereutectic aluminium—silicon alloys;Proceedings of the Institution of Mechanical Engineers, Part J: Journal of Engineering Tribology;2009-01-16

4. Improvement of the duty cycle of an orthogonal acceleration time-of-flight mass spectrometer using ion gates;Rapid Communications in Mass Spectrometry;2007

5. Atomic spectrometry update. Atomic mass spectrometry;Journal of Analytical Atomic Spectrometry;2007
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