Closed-form solutions for the frequency shift of V-shaped probes scanning an inclined surface-Reference-Cited by-同舟云学术

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Closed-form solutions for the frequency shift of V-shaped probes scanning an inclined surface

Published:2006-07 Issue:18 Volume:252 Page:6249-6259
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Lin Shueei-Muh,Lee Sen-Yung,Chen Bin-Shin

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference16 articles.

1. Atomic force microscope;Binnig;Phys. Rev. Lett.,1986

2. Advances in atomic force microscopy;Giessibl;Rev. Mod. Phys.,2003

3. Calculation of the frequency shift in dynamic force microscopy;Hölscher;Appl. Surf. Sci.,1999

4. Dynamics of the cantilever in noncontact atomic force microscopy;Sasaki;Appl. Phys. A: Mater.,1998

5. Vibrations of free and surface-coupled force microscope cantilevers: theory and experiment;Rabe;Am. Inst. Phys.,1996

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1. Measurement Error of a Coupled AFM Probe-Elastic Membrane System;Mathematical Problems in Engineering;2018-09-02

2. Modeling and simulation of AFM cantilever with two piezoelectric layers submerged in liquid over rough surfaces;Precision Engineering;2015-10

3. Modelando la dinámica de un cantiléver de Microscopia de Fuerza Atómica AFM;Revista Científica;2013-12-31

4. Vibration response of a piezoelectrically actuated microcantilever subjected to tip–sample interaction;Scientia Iranica;2013-01

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