Characterization of stabilized ZrO2 thin films obtained by sol-gel method-Reference-Cited by-同舟云学术

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Characterization of stabilized ZrO2 thin films obtained by sol-gel method

Published:2021-12 Issue: Volume:569 Page:150787
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Mansilla Y.,Arce M.D.,González-Oliver C.,Basbus J.,Troiani H.,Serquis A.

Funder

Consejo Nacional de Investigaciones Científicas y Técnicas

Agencia Nacional De Promoción Científica Y Tecnológica

Universidad Nacional de Cuyo

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference56 articles.

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2. Effect of the oxygen partial pressure on the toughness of tetragonal zirconia thin films for optical applications;Andrieux;Appl. Surf. Sci.,2012

3. Zirconia based dental ceramics: structure, mechanical properties, biocompatibility and applications;Gautam;Dalt. Trans.,2016

4. Synthesis of nanocrystalline high-temperature zirconia phases;Petrunin;Inorg. Mater.,2004

5. A composite sol-gel process to prepare a YSZ electrolyte for solid oxide fuel cells;Courtin;J. Power Sources,2012

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2. Conduction mechanisms analysis of ZrO2-based electrochemical metallization RRAM in different RESET modes;Chinese Journal of Physics;2024-10

3. A new way to tune photocatalytic activity, surface morphology, and structural/optical parameters of ZrO2 thin films using different Zr sources along with annealing temperature and film thickness;Journal of Sol-Gel Science and Technology;2024-09-09

4. Remote vapor-phase dual alkali halide salts assisted quasi-van der Waals epitaxy of m-phase ZrO2 thin films with high dielectric constant and stable flexible properties;Applied Physics Letters;2024-08-19

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