Laser-induced surface recrystallization of polycrystalline PbI2 thick films for X-ray detector application

Author:

Sun Hui,Zhao Beijun,Zhu Xinghua,Zhu Shifu,Yang Dingyu,Wangyang Peihua,Gao Xiuyin

Funder

National Natural Science Foundation of China

Science and Technology Research Fund of Sichuan Province

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference23 articles.

1. X-ray imaging with PbI2-based A-Si:H flat panel detectors;Shah;Nucl. Instrum. Methods Phys. Res. A,2001

2. Examination of HgI2 and PbI2 photoconductive materials for direct detection, active matrix, flat-panel imagers for diagnostic X-ray imaging;Kang,2003

3. PbI2 thick films: growth, properties, and problems;Dmitriev;Nucl. Instrum. Methods Phys. Res. A,2008

4. Growth, surface treatment and characterization of polycrystalline lead iodide thick films prepared using close space deposition technique;Zhu;Nucl. Instrum. Methods Phys. Res. A,2012

5. Fabrication and characterization of X-ray array detectors based on polycrystalline PbI2 thick films;Zhu;J. Mater. Sci.: Mater. Electron.,2014

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