Author:
Kim J.J.,Ikenaga E.,Kobata M.,Takeuchi A.,Awaji M.,Makino H.,Chen P.P.,Yamamoto A.,Matsuoka T.,Miwa D.,Nishino Y.,Yamamoto T.,Yao T.,Kobayashi K.
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference19 articles.
1. The electron inelastic-mean-free-paths were estimated using NIST Standard Reference Database 71, “NIST Electron Ineleastic-Mean-Free-Path Database: Ver. 1. 1.” It is distributed via the Web site http://www.nist.gov/srd/nist.htm, and references therein.
2. X-ray photoemission spectroscopy
3. Atomic subshell photoionization cross sections and asymmetry parameters: 1 ⩽ Z ⩽ 103
4. Insertion devices for third‐generation light sources (invited)
5. Recent trends of insertion-device technology for X-ray sources
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