RETRACTED: Spectral diffuse reflectance measurements of gadolinia, silica thin film systems using synchrotron radiation-Reference-Cited by-同舟云学术

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RETRACTED: Spectral diffuse reflectance measurements of gadolinia, silica thin film systems using synchrotron radiation

Published:2007-03 Issue:10 Volume:253 Page:4515-4523
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Sahoo N.K.,Thakur S.,Tokas R.B.,Sekhar B.N. Raja

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference28 articles.

1. Effects of interface roughness on the spectral properties of thin films and multilayers

2. Roughness and light scattering of ion-beam-sputtered fluoride coatings for 193 nm

3. Optical Scattering in Multilayer Thin Films

4. Diffraction and diffuse scattering from dielectric multilayers

5. From light scattering to the microstructure of thin-film multilayers

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1. Optical, electrical and ac conductivity measurements of nonlinear optical Dimethylaminomethylphthalimide doped with cadmium chloride single crystal for nano applications;Optics Communications;2013-07

2. Research Activities Using Indus-1 Synchrotron Radiation Source;AIP Conference Proceedings;2010

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