Infrared Spectroscopic Ellipsometry analysis of Nano-structured thin films in polymers and semiconductors-Reference-Cited by-同舟云学术

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Infrared Spectroscopic Ellipsometry analysis of Nano-structured thin films in polymers and semiconductors

Published:2009-11 Issue:3 Volume:256 Page:S72-S76
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Stehle Jean Louis,Piel Jean Philippe

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference11 articles.

1. MRS Fall meeting;Boher,2000

2. EMRS Spring meeting;Pickering,2001

3. Infrared Spectroscopic Ellipsometry;Roseler,1981

4. Mueller matrix analysis of infrared ellipsometry

5. Infra-red properties of bulk heavily doped silicon

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Spectroscopic ellipsometry;Handbook of Modern Coating Technologies;2021

2. Heterostructured Layer Growth of Polyaniline by Vacuum Thermal Evaporation and Fabrication of Thin-Film Capacitors;The Journal of Physical Chemistry C;2019-10-25

3. Structure and Interactions of Polymer Thin Films from Infrared Ellipsometry;Ellipsometry of Functional Organic Surfaces and Films;2018

4. Infrared ellipsometry for improved laterally resolved analysis of thin films;Thin Solid Films;2014-11

5. Characterization of Polymer Blends: Ellipsometry;Characterization of Polymer Blends;2014-10-31

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