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Electrochemically deposited cobalt/platinum (Co/Pt) film into porous silicon: Structural investigation and magnetic properties

  • Published:2013-01 Issue: Volume:264 Page:391-398
  • ISSN:0169-4332
  • Container-title:Applied Surface Science
  • language:en
  • Short-container-title:Applied Surface Science

Author:

Harraz F.A.,Salem A.M.,Mohamed B.A.,Kandil A.,Ibrahim I.A.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference49 articles.

1. Luminescence degradation in porous silicon;Tischler;Appl. Phys. Lett.,1992

2. The structural and luminescence properties of porous silicon;Cullis;J. Appl. Phys.,1997

3. The physics of macropore formation in low doped n-type silicon;Lehmann;J. Electrochem. Soc.,1993

4. The electrochemical oxidation of silicon and formation of porous silicon in acetonitrile;Propst;J. Electrochem. Soc.,1994

5. Electrochemistry of Silicon: Instrumentation, Science Materials and Applications;Lehmann,2002
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