Significant effect of substrate temperature on the phase structure, optical and electrical properties of RF sputtered CIGS films-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Significant effect of substrate temperature on the phase structure, optical and electrical properties of RF sputtered CIGS films

Published:2013-01 Issue: Volume:264 Page:197-201
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Yu Zhou,Yan Yong,Li Shasha,Zhang Yanxia,Yan Chuanpeng,Liu Lian,Zhang Yong,Zhao Yong

Funder

National Natural Science Foundation of China

International Thermonuclear Experimental Reactor (ITER) Program

Fundamental Research Funds for the Central Universities

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference32 articles.

1. New world record efficiency for Cu(In,Ga)Se2 thin-film solar cells beyond 20%

2. 19·9%-efficient ZnO/CdS/CuInGaSe2 solar cell with 81·2% fill factor

3. High quality baseline for high efficiency, Cu(In1−x,Gax)Se2 solar cells

4. Manufacturing and application of CIS solar modules

5. Low cost processing of CIGS thin film solar cells

Cited by 33 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation on the diffusion mechanism of Ga element and regulation of the V-shaped bandgap in CIGS thin films based on magnetron sputtering with a quaternary target;Solar Energy;2024-05

2. Fabrication of CIGS-Based Photodetector Using Sputtering Method;2024

3. Influence of The Substrate-Target Angle and Sputter Temperature On The Properties of CIGS Thin Films Sputtered From Single Quaternary Target;Cumhuriyet Science Journal;2023-06-30

4. Effect of gallium proportion on the structural, optical, and electrical properties of the CuIn1-xGaxSe2 compound;The International Journal of Advanced Manufacturing Technology;2022-11-11

5. Influence of CIGS film thickness on the microstructure, bulk optoelectronic, and surface electrical properties;Journal of Materials Science: Materials in Electronics;2021-10-23

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3