Principal component analysis of TOF-SIMS spectra, images and depth profiles: an industrial perspective
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference5 articles.
1. Interpretation of Static Time-of-Flight Secondary Ion Mass Spectra of Adsorbed Protein Films by Multivariate Pattern Recognition
2. Principal Component Analysis of TOF-SIMS Images of Organic Monolayers
3. Multivariate Analysis of TOF-SIMS Spectra from Dodecanethiol SAM Assembly on Gold: Spectral Interpretation and TOF-SIMS Fragmentation Processes
4. Characterization of sequentially grafted polysaccharide coatings using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and principal component analysis (PCA)
5. Characterization of lead-titanium-oxygen compounds by static SIMS
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1. Secondary Ion Mass Spectral Imaging of Metals and Alloys;Materials;2024-01-22
2. Dimensional Stacking for Machine Learning in ToF‐SIMS Analysis of Heterostructures;Advanced Materials Interfaces;2020-12-10
3. Efficient and sample‐specific interpretation of ToF‐SIMS data by additional postprocessing of principal component analysis results;Surface and Interface Analysis;2019-09-02
4. Confirmation of Interlayer Sulfidization of Malachite by TOF-SIMS and Principal Component Analysis;Minerals;2019-03-29
5. Effect of Mn loading onto hydroxyapatite supported Mn catalysts for toluene removal: Contribution of PCA assisted ToF-SIMS;Catalysis Today;2018-06
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