ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin films-Reference-Cited by-同舟云学术

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ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin films

Published:2004-06 Issue: Volume:231-232 Page:289-295
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Kailas L.,Audinot J.-N.,Migeon H.-N.,Bertrand P.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference4 articles.

1. I.M. Campbell, Introduction to Synthetic Polymers, Oxford University Press, New York, 1994.

2. L. Kailas, B. Nysten, P. Bertrand, Surf. Interface Anal., in press.

3. X-ray spectromicroscopy of immiscible polymer blends: polystyrene–poly(methyl methacrylate)

4. Film Thickness Dependence of the Surface Structure of Immiscible Polystyrene/Poly(methyl methacrylate) Blends

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