C60 cluster ion bombardment of organic surfaces-Reference-Cited by-同舟云学术

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C60 cluster ion bombardment of organic surfaces

Published:2004-06 Issue: Volume:231-232 Page:146-152
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Weibel D.E.,Lockyer N.,Vickerman J.C.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference26 articles.

1. J.C. Vickerman, D. Briggs, ToF-SIMS: Surface Analysis by Mass Spectrometry, IMP Publications and SurfaceSpectra Limited, Manchester, 2001.

2. Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organics

3. Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardment

4. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

5. Cluster impacts at keV and MeV energies: Secondary emission phenomena

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