Sputtering of indium using polyatomic projectiles
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
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1. Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment
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1. Ionization probability of sputtered indium under irradiation with 20-keV fullerene and argon gas cluster projectiles;International Journal of Mass Spectrometry;2019-04
2. Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS);Technical Physics;2013-06
3. Indium sputtering upon bombardment with cluster ions;Bulletin of the Russian Academy of Sciences: Physics;2012-05
4. Relationships between cluster secondary ion mass intensities generated by different cluster primary ions;Journal of the American Society for Mass Spectrometry;2010-03-01
5. Cluster Primary Ion Sputtering: Secondary Ion Intensities in Static SIMS of Organic Materials;The Journal of Physical Chemistry C;2009-10-14
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