Organic SIMS: the influence of time on the ion yield enhancement by silver and gold deposition-Reference-Cited by-同舟云学术

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Organic SIMS: the influence of time on the ion yield enhancement by silver and gold deposition

Published:2004-06 Issue: Volume:231-232 Page:256-260
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Adriaensen L.,Vangaever F.,Gijbels R.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference3 articles.

1. Organic Secondary Ion Mass Spectrometry: Sensitivity Enhancement by Gold Deposition

2. Time-of-flight secondary ion mass spectrometric analysis of polymer surfaces and additives

3. H. Yanashima, M. Sado, M. Minobe, in: A. Benninghoven, B. Hagenhoff, H.W. Werner (Eds.), Secondary Ion Mass Spectrometry SIMS X proceedings, Wiley, New York, 1997, p. 751.

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2. Application of ToF-SIMS to the study on heartwood formation in Cryptomeria japonica trees;Applied Surface Science;2008-12

3. Imaging mass spectrometry;Mass Spectrometry Reviews;2007-04-30

4. In situ temperature-time effect on MetA-S-SIMS;Journal of the American Society for Mass Spectrometry;2007-03-01

5. Imaging of peptides in the rat brain using MALDI-FTICR mass spectrometry;Journal of the American Society for Mass Spectrometry;2007-01-01

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