Identification of ZnTiO3 nanostructures in oxidized TiN/ZnS thin films using X-ray absorption spectroscopy-Reference-Cited by-同舟云学术

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Identification of ZnTiO3 nanostructures in oxidized TiN/ZnS thin films using X-ray absorption spectroscopy

Published:2019-11 Issue: Volume:494 Page:63-71
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Lee Minji,Mohamed Ahmed Y.,Kim Doyeong,Kim Dae Hyun,Park Tae Joo,Cho Deok-Yong

Funder

National Research Foundation of Korea

Ministry of Education

Future Semiconductor Device Technology Development Program

Ministry of Trade, Industry & Energy

Korea Semiconductor Research Consortium

MSIP

PAL

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference72 articles.

1. ZnO/Ag/ZnO multilayer films for the application of a very low resistance transparent electrode;Sahu;Appl. Surf. Sci.,2006

2. Modified resistive switching behavior of ZrO2 memory films based on the interface layer formed by using Ti top electrode;Lin;J. Appl. Phys.,2007

3. The role of the HfO2–TiN interface in capacitance–voltage nonlinearity of metal-insulator-metal capacitors;Wenger;Thin Solid Films,2009

4. A 15% efficient antireflection-coated metal-oxide-semiconductor solar cell;Stirn;Appl. Phys. Lett.,1975

5. Review of conductor-insulator-semiconductor (CIS) solar cells;Singh;Solar Cells,1981

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2. Chemical Influence of Carbon Interface Layers in Metal/Oxide Resistive Switches;ACS Applied Materials & Interfaces;2023-03-29

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