A critical review of the passivation and semiconductor mechanisms of chalcopyrite leaching-Reference-Cited by-同舟云学术

A critical review of the passivation and semiconductor mechanisms of chalcopyrite leaching

Published:2020-08 Issue: Volume:154 Page:106401
ISSN:0892-6875
Container-title:Minerals Engineering
language:en
Short-container-title:Minerals Engineering

Author:

O'Connor G.M.,Eksteen J.J.

Funder

Curtin University

Publisher

Elsevier BV

Subject

Mechanical Engineering,Geotechnical Engineering and Engineering Geology,General Chemistry,Control and Systems Engineering

Reference114 articles.

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3. Oxidation Menagee de la Chalcopyrite en Solutionacide: Analyse Cinetique des Reactions: I. Modeles Chimiques;Ammou-Chokroum;Bull. Soc. Fr. Mineral. Cristallogr. / Bulletin de la Socieìteì Francì§Aise De Mineìralogie Et De Cristallographie.,1977

4. Simulating the main stages of chalcopyrite leaching and bioleaching in ferrous ions solution: an electrochemical impedance study with a modified carbon paste electrode;Arena;Miner. Eng.,2016

5. Selective Dissolution below the Critical Potential and Back Alloying in Copper-Gold Alloy;Ateya;J. Electrochem. Soc.,2002

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