Influence of chain sequence structure of polymers on ToF-SIMS spectra
Author:
Publisher
Elsevier BV
Subject
Polymers and Plastics,Materials Chemistry,Organic Chemistry
Reference17 articles.
1. Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
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3. Handbook of static secondary ion mass spectrometry (SIMS);Briggs,1989
4. Influence of Tacticity on Polymer Surfaces Studiedby ToF-SIMS
5. Determination of the Distribution of Poly(dimethylsiloxane) Segment Lengths at the Surface of Poly[(dimethylsiloxane)−urethane]-Segmented Copolymers by Time-of-Flight Secondary Ion Mass Spectrometry
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