Focused ion beam/lift-out transmission electron microscopy cross sections of block copolymer films ordered on silicon substrates-Reference-Cited by-同舟云学术

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Focused ion beam/lift-out transmission electron microscopy cross sections of block copolymer films ordered on silicon substrates

Published:2001-02 Issue:4 Volume:42 Page:1613-1619
ISSN:0032-3861
Container-title:Polymer
language:en
Short-container-title:Polymer

Author:

White H,Pu Y,Rafailovich M,Sokolov J,King A.H,Giannuzzi L.A,Urbanik-Shannon C,Kempshall B.W,Eisenberg A,Schwarz S.A,Strzhemechny Y.M

Publisher

Elsevier BV

Subject

Polymers and Plastics,Materials Chemistry,Organic Chemistry

Reference57 articles.

1. Spinodal decomposition in thin films of a polymer blend

2. Surface phase inversion in finite-sized binary mixtures

3. Wetting Behavior of Homopolymer Films on Chemically Similar Block Copolymer Surfaces

4. Surface segregation amplification in miscible polymer blends near criticality

5. Phase-Separation-Induced Surface Patterns in Thin Polymer Blend Films

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2. Far-reaching geometrical artefacts due to thermal decomposition of polymeric coatings around focused ion beam milled pigment particles;Journal of Microscopy;2015-12-22

3. FIB processing for natural rubber with nanomatrix structure;Polymer;2015-01

4. The Morphology of Ordered Block Copolymer Patterns as Probed by High Resolution Imaging;Nanomaterials and Nanotechnology;2014-01-01

5. Size effect in microcompression of epoxy micropillars;Journal of Materials Science;2012-05-04

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