Noise

Author:

Chauhan Yogesh Singh,Pahwa Girish,Dasgupta Avirup,Lu Darsen,Venugopalan Sriramkumar,Khandelwal Sourabh,Duarte Juan Pablo,Paydavosi Navid,Niknejad Ali,Hu Chenming,Salahuddin Sayeef

Publisher

Elsevier

Reference15 articles.

1. BSIM4 MOSFET Model User’s Manual, Available from: http://www-device.eecs.berkeley.edu/bsim/.

2. Characterization and modeling of flicker noise in FinFETs at advanced technology node;Kushwaha;IEEE Electron Device Lett,2019

3. Correlated noise modeling and simulation;McAndrew;Workshop on compact modeling,2005

4. Extraction of the induced gate noise, channel noise, and their correlation in submicron MOSFETs from RF noise measurements;Chen;IEEE Trans. Electron Devices,2001

5. D. Lu, Compact Models for Future Generation CMOS (Ph.D. thesis), UC Berkeley, 2011.

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