The transient response of a coating–substrate structure with a crack in the functionally graded interfacial layer
Author:
Publisher
Elsevier BV
Subject
Civil and Structural Engineering,Ceramics and Composites
Reference18 articles.
1. On the Mechanical modeling of the interfacial region in bonded half-planes;Delale;J Appl Mech,1988
2. Stress intensity factors around a crack in a nonhomogeneous interfacial layer between two dissimilar elastic half-planes;Itou;Int J Fract,2001
3. The surface crack problem for a plate with functionally graded properties;Erdogan;J Appl Mech,1997
4. Mode I crack problem for a functionally graded orthotropic strip;Guo;Eur J Mech A/Solids,2004
5. An analysis of cracking in a layered medium with a functionally graded nonhomogeneous interface;Choi;ASME, J Appl Mech,1996
Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Automatic high depth-resolvability inspection of TBC debonding defects using nonlinear frequency modulation photothermal radar;NDT & E International;2024-01
2. Evaluation of stress intensity factors in functionally graded plate under mechanical and thermal loadings;International Journal on Interactive Design and Manufacturing (IJIDeM);2023-01-27
3. Three-dimensional dynamic Green’s functions in exponentially graded transversely isotropic tri-material composites;Mathematics and Mechanics of Solids;2022-07-13
4. Dynamic Fracture Analysis of Functionally Graded Material Structures – A Critical Review;Composites Part C: Open Access;2022-03
5. The photothermal wave field and high-resolution photothermal pulse compression thermography for ceramic/metal composite solids;Composite Structures;2022-02
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3