An angle-scanned photoelectron diffraction (XPD) study of the growth and structure of ultrathin Fe films on Au(001)-Reference-Cited by-同舟云学术

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An angle-scanned photoelectron diffraction (XPD) study of the growth and structure of ultrathin Fe films on Au(001)

Published:1997-01 Issue:2-3 Volume:370 Page:293-310
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Opitz R,Löbus S,Thissen A,Courths R

Funder

Deutsche Forschungsgemeinschaft

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference52 articles.

1. Ultrathin Magnetic Structures I and II: An Introduction to Electronic, Magnetic, and Structural Properties,1994

2. Photoelectron diffraction

3. X-Ray photoelectron and auger electroo forward scattering: A new tool for surface crystallography

4. Epitaxial film crystallography by high-energy Auger and X-ray photoelectron diffraction

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