The structure and thermal behavior of Cu on ultrathin films of SiO2 on Si(111)-Reference-Cited by-同舟云学术

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The structure and thermal behavior of Cu on ultrathin films of SiO2 on Si(111)

Published:1997-02 Issue:1-3 Volume:372 Page:21-27
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Zhou J.B.,Gustafsson T.,Garfunkel E.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference14 articles.

1. VLSI Technology;Sze,1983

2. Catalysis at Surfaces;Campbell,1988

3. Medium energy ion scattering study of Ni on ultrathin films of SiO2 on Si(111)

4. Materials Analysis by Ion Channeling;Feldman,1982

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