In situ work function study of oxidation and thin film growth on clean surfaces
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference18 articles.
1. V. Contact electricity of metals
2. A NEW METHOD OF MEASURING CONTACT POTENTIAL DIFFERENCES IN METALS
3. Analysis of stray capacitance in the Kelvin method
4. Noise and the Kelvin method
5. Conditions necessary to get meaningful measurements from the Kelvin method
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