Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes-Reference-Cited by-同舟云学术

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Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes

Published:2002-06 Issue: Volume:507-510 Page:473-479
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Suess C.,Wenzl F.P.,Jakopic G.,Wuchse M.,Muellegger S.,Koch N.,Haase A.,Lamprecht K.,Schatzmayr M.,Mitterbauer C.,Hofer F.,Leising G.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference26 articles.

1. Organic electroluminescent diodes

2. Light-emitting diodes based on conjugated polymers

3. Deposition-induced photoluminescence quenching of tris-(8-hydroxyquinoline) aluminum

4. Carrier tunneling and device characteristics in polymer light‐emitting diodes

5. Effect of metal films on the photoluminescence and electroluminescence of conjugated polymers

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