Observation of intensity oscillations in rheed during the epitaxial growth of Cu and fcc Fe on Cu(100)
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference13 articles.
1. Origin of azimuthal effect of RHEED intensity oscillations observed during MBE
2. Intensity oscillations of reflection high‐energy electron diffraction during silicon molecular beam epitaxial growth
3. Damped oscillations in reflection high energy electron diffraction during GaAs MBE
4. Reflection high energy electron diffraction studies of epitaxial growth on semiconductor surfaces
5. Dynamics of film growth of GaAs by MBE from Rheed observations
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