Image topography of alkyl-substituted carboxylates observed by noncontact atomic force microscopy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference24 articles.
1. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
2. Observation of $\bf 7\times 7$ Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy
3. Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy
4. Imaging of individual formate ions adsorbed on TiO2(110) surface by non-contact atomic force microscopy
5. Fluctuation of acetate ions in the (2×1)-acetate overlayer on TiO2(110)-(1×1) observed by noncontact atomic force microscopy
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