The contrast mechanism for true atomic resolution by AFM in non-contact mode: quasi-non-contact mode?
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference11 articles.
1. Atomic Force Microscope
2. True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive Forces
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4. Observation of Atomic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM)
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