Fine structure in auger electron spectra
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference20 articles.
1. J. Stöhr, in: X-ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES, Eds. R. Prins and D. Koningsberger (Wiley, New York, to be published).
2. Fine structure in ionisation cross sections and applications to surface science
3. Evidence of extended fine structures in the Auger spectra: A new approach for surface structural studies
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2. Determination of parameters of the local atomic surrounding in surface layers of Fe, Ni and Cu by the secondary electron fine structure method;Journal of Electron Spectroscopy and Related Phenomena;2002-08
3. Fine determination of interatomic distances on surface using extended energy-loss fine structure (EELFS) data: peculiarities of the technique;Surface and Interface Analysis;2002
4. EXFAS electron spectroscopy as a new tool of local characterisation of copper in Cu-Beta zeolite;Solid State Sciences;2001-08
5. SECONDARY ELECTRON FINE STRUCTURE—A METHOD OF LOCAL ATOMIC STRUCTURE CHARACTERIZATION;Handbook of Surfaces and Interfaces of Materials;2001
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