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Design of an atomic force microscope and first results

  • Published:1987-10 Issue: Volume:189-190 Page:29-35
  • ISSN:0039-6028
  • Container-title:Surface Science
  • language:en
  • Short-container-title:Surface Science

Author:

Heinzelmann H.,Grütter P.,Meyer E.,Hidber H.,Rosenthaler L.,Ringger M.,Güntherodt H.-J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Advances in AFM for the electrical characterization of semiconductors;Reports on Progress in Physics;2008-06-20

2. Microscopy of Coatings;Encyclopedia of Analytical Chemistry;2006-09-15

3. Nanoscale characterization of semiconductor materials and devices using scanning probe techniques;Materials Science and Engineering: R: Reports;1996-11

4. Chapter 136 The intricate world of rare earth thin films: Metals, alloys, intermetallics, chemical compounds, …;Handbook on the Physics and Chemistry of Rare Earths Volume 20;1995

5. Scanned‐cantilever atomic force microscope;Review of Scientific Instruments;1993-04
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