Solution of Ge(111)-(4×4)-Ag structure using direct methods applied to X-ray diffraction data-Reference-Cited by-同舟云学术

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Solution of Ge(111)-(4×4)-Ag structure using direct methods applied to X-ray diffraction data

Published:1998-12 Issue:2 Volume:418 Page:395-406
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Collazo-Davila C.,Grozea D.,Marks L.D.,Feidenhans'l R.,Nielsen M.,Seehofer L.,Lottermoser L.,Falkenberg G.,Johnson R.L.,Göthelid M.,Karlsson U.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference40 articles.

1. Physics and electronics of the noble-metal/elemental-semiconductor interface formation: A status report

2. Atomic geometry of Ge(111) √3 × √3R30°-Ag determined by low-energy electron diffraction

3. Structural and electronic evolution on the Ge(111)-Ag surface

4. STM studies of submonolayer coverages of Ag on Ge(111)

5. Structure of the (√3 × √3 )R30° Ag/Si(111) surface from first-principles calculations

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1. Observations of the Ag(3 × 1) phase on Ge(111);Journal of Vacuum Science & Technology A;2021-09

2. Epitaxial Growth of Main Group Monoelemental 2D Materials;Advanced Functional Materials;2020-11-02

3. Structure determination of the ordered 3×3R30° phase of Ni2Si and Ni2Ge surface alloys on Ni(111) via low-energy electron diffraction;Surface Science;2015-12

4. High temperature growth of Ag phases on Ge(111);Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2013-03

5. Well-Ordered Transition Metal Oxide Layers in Model Catalysis – A Series of Case Studies;Chemical Reviews;2013-02-07

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