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Molecular dynamics simulations to explore the effect of projectile size on the ejection of organic targets from metal surfaces

  • Published:1998-03 Issue:1-3 Volume:174 Page:155-166
  • ISSN:0168-1176
  • Container-title:International Journal of Mass Spectrometry and Ion Processes
  • language:en
  • Short-container-title:International Journal of Mass Spectrometry and Ion Processes

Author:

Žarić Radomir,Pearson Brenda,Krantzman Kristin D.,Garrison Barbara J.

Publisher

Elsevier BV

Subject

Spectroscopy

Reference45 articles.

1. Secondary Ion Mass Spectrometry;Vickerman,1989

2. Secondary Ion Mass Spectrometry;Vickerman,1989

3. Ion beams and laser postionization for molecule-specific imaging

4. Ion Spectroscopies for Surface Analysis;Winograd,1991

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1. New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications;Review of Scientific Instruments;2007-08

2. Enhanced secondary ion emission with a bismuth cluster ion source;International Journal of Mass Spectrometry;2007-04

3. Laser Microprobe with Fourier Transform Ion Cyclotron Resonance Mass Spectrometer for Surface Analysis;Analytical Chemistry;2006-11-23

4. An investigation of enhanced secondary ion emission under Aun+ (n=1–7) bombardment;Journal of the American Society for Mass Spectrometry;2005-05-01

5. Molecular dynamics simulations of low energy ion sputtering of copper nano-dimensional clusters on graphite substrates;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-01
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