Beam distortions and their compensation in sector field mass spectrometers-Reference-Cited by-同舟云学术

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Beam distortions and their compensation in sector field mass spectrometers

Published:1997-12 Issue:1-3 Volume:171 Page:203-208
ISSN:0168-1176
Container-title:International Journal of Mass Spectrometry and Ion Processes
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Processes

Author:

Yavor M.I.,Berdnikov A.S.,Wollnik H.

Publisher

Elsevier BV

Subject

Spectroscopy

Reference10 articles.

1. Parasitic aberrations in static sector field mass analyzers and their correction. Part 1. First order approximation

2. ISIOS: a program to calculate imperfect static charged particle optical systems

3. H. Wollnik and H. Matsuda, private communication (1969).

4. Double focusing mass spectrometers of second order

5. Influence of imperfect alignment of median planes on focusing properties

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Chapter 7 Mass Analyzers With Combined Electrostatic and Magnetic Fields;Advances in Imaging and Electron Physics;2009

2. Chapter 1 Charged Particles in Electromagnetic Fields;Advances in Imaging and Electron Physics;2009

3. References;Advances in Imaging and Electron Physics;2009

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