Chapter 3: Application and Deterioration of Thin Films Used for Microelectronic Devices
Reference57 articles.
1. Electronic Properties of Materials;Hummel,1985
2. Thin Films – Interdiffusion and Reactions, Diffusion Barriers,1978
3. Diffusion barriers in thin films
4. In situ formation of diffusion barriers in thin film metallization systems
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献