Author:
Henry N,Deniard P,Jobic S,Brec R,Fillet C,Bart F,Grandjean A,Pinet O
Subject
Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Determination of the crystallized fractions of a largely amorphous multiphase material by the Rietveld method
2. A profile refinement method for nuclear and magnetic structures
3. V. Petricek, M. Dusek, in: JANA 2000, Institute of Physics, Academy of Sciences of the Czech Republic, Prague, Czech Republic, 1998
4. Rietveld refinement of Debye–Scherrer synchrotron X-ray data from Al2O3
5. UTHSCSA Image Tool software, version 3.0, The University of Texas, Health Science Center, San Antonio, TX, 1995–2002
Cited by
52 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献