Surface pattern recording in amorphous chalcogenide layers-Reference-Cited by-同舟云学术

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Surface pattern recording in amorphous chalcogenide layers

Published:2009-10 Issue:37-42 Volume:355 Page:1849-1852
ISSN:0022-3093
Container-title:Journal of Non-Crystalline Solids
language:en
Short-container-title:Journal of Non-Crystalline Solids

Author:

Takáts Viktor,Miller F.C.,Jain Himanshu,Cserháti C.,Szabó I.A.,Beke D.,Kokenyesi S.

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Handbook of Advanced and Photonic Materials and Devices;Kolobov,2001

2. Photoexpansion inAs2S3glass

3. Electron irradiation induced expansion in amorphous chalcogenide films

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1. Concentration-dependent enhancement of nonlinear optical properties in Ge-Te-Bi nano colloidal solutions;Phase Transitions;2023-03-14

2. Effects of electron beam irradiation on a Ag/AsS2 bilayer using conductive atomic force microscopy;Thin Solid Films;2021-08

3. A review on solution processing of chalcogenide glasses for optical components;Optical Materials Express;2013-08-08

4. Electron beam induced surface modification of amorphous Sb2Se3 thin film;Journal of Non-Crystalline Solids;2012-04

5. Ag2Se micropatterns via viscoelastic flow-driven phase separation;RSC Advances;2012

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