Examination of local structure of composite and low dimension semiconductor with X-ray absorption spectroscopy-Reference-Cited by-同舟云学术

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Examination of local structure of composite and low dimension semiconductor with X-ray absorption spectroscopy

Published:2006-11 Issue:40-41 Volume:352 Page:4190-4199
ISSN:0022-3093
Container-title:Journal of Non-Crystalline Solids
language:en
Short-container-title:Journal of Non-Crystalline Solids

Author:

Lawniczak-Jablonska K.,Demchenko I.N.,Piskorska E.,Wolska A.,Talik E.,Zakharov D.N.,Liliental-Weber Z.

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. X-ray Absorption: Principles, Application, Techniques;Koingsberger,1988

2. Encyclopedia of Analytical Chemistry;Kawai,2000

3. cBN–TiN, cBN–TiC composites: chemical equilibria, microstructure and hardness mechanical investigations

4. Characterization of the c-BN/TiC, Ti3SiC2 systems by element selective spectroscopy

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Alloying Effect in CoPt Nanoparticles Probed by X-ray Photoemission Spectroscopy: Validity of the Bulk Phase Diagram;The Journal of Physical Chemistry C;2010-07-19

2. Quantitative phase analysis of cubic boron nitride based composites by X-ray absorption near edge structure;Spectrochimica Acta Part B: Atomic Spectroscopy;2007-05

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