The influence of the trapping potential on the attachment of a second electron to stored metal cluster and fullerene anions-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

The influence of the trapping potential on the attachment of a second electron to stored metal cluster and fullerene anions

Published:2002-07 Issue:3 Volume:218 Page:217-225
ISSN:1387-3806
Container-title:International Journal of Mass Spectrometry
language:en
Short-container-title:International Journal of Mass Spectrometry

Author:

Herlert A.,Jertz R.,Alonso Otamendi J.,González Martı́nez A.J.,Schweikhard L.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation

Reference46 articles.

1. Gas-Phase Multiply Charged Anions

2. Multiply Charged Anions in the Gas Phase

3. Production of small doubly charged negative carbon cluster ions by sputtering

4. Doubly charged negative silicon-carbon clusters produced in sputtering

5. Observation of BeC2−n, a particularly abundant gaseous dianion

Cited by 39 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electron attachment to anionic clusters in ion traps;Hyperfine Interactions;2015-05-28

2. The interaction of He− with fullerenes;The Journal of Chemical Physics;2015-03-14

3. Upgrades at ClusterTrap and latest results;International Journal of Mass Spectrometry;2014-05

4. Gas Phase Formation, Structure and Reactivity of Gold Cluster Ions;Structure and Bonding;2014

5. Appearance size of poly-anionic aluminum clusters, Aln z-, z = 2–5*;The European Physical Journal D;2013-02

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP