Monte Carlo simulation of charge exchange processes in the scattering of 4keV He+ ions by an amorphous silicon surface-Reference-Cited by-同舟云学术

Monte Carlo simulation of charge exchange processes in the scattering of 4keV He+ ions by an amorphous silicon surface

Published:2007-05 Issue:1 Volume:258 Page:40-43
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Khalal-Kouache K.,Chami A.C.,Boudjema M.,Benazeth C.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference24 articles.

1. Low Energy Ion–Surface Interactions, J.W. Rabalais (Ed.), John Wiley and Sons.

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1. Multiple scattering of low energy ions in matter: Influence of energy loss and interaction potential;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-07

3. Effect of energy loss in the simulation of slow ion scattering by a solid surface;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-03