Author:
Terada Masashi,Nakamura Nobuyuki,Nakai Yoichi,Kanai Yasuyuki,Ohtani Shunsuke,Komaki Ken-ichiro,Yamazaki Yasunori
Subject
Instrumentation,Nuclear and High Energy Physics
Reference10 articles.
1. Scanning tunneling microscopy and atomic force microscopy study of graphite defects produced by bombarding with highly charged ions;Mochiji;J. Appl. Phys.,1997
2. Nanoscopic surface modification by slow ion bombardment;Gebeshuber;Int. J. Mass Spectrom.,2003
3. N. Nakamura, A. Endo, Y. Nakai, Y. Kanai, K. Komaki, Y. Yamazaki, Compact electron beam ion source with high-Tc bulk superconductors, Rev. Sci. Instr., in press.
4. An overview of the Tokyo electron beam ion trap;Nakamura;Phys. Scr. T,1997
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