Investigation of change of the composition and structure of the CaF2/Si films surface at the low-energy bombardment-Reference-Cited by-同舟云学术

Investigation of change of the composition and structure of the CaF2/Si films surface at the low-energy bombardment

Published:2014-05 Issue: Volume:326 Page:322-325
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Umirzakov B.E.,Tashmukhamedova D.A.,Ruzibaeva M.K.,Djurabekova F.G.,Danaev S.B.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference9 articles.

1. L.T. Chadderton, R. Jonckheere, R. Ewing, A.S. Khalil, C. Weise, L. Wang, M.C. Ridgway, A.M. Stewart, C. Trautmann, IN: Book of Reports of XVII International Conference “Ion-surface interactions”, Vol.1 (2005) p.79.

2. Optical gain in silicon nanocrystals

3. Copper phthalocyanine organic thin-film transistors with calcium fluoride gate insulator

4. Formation of CaF2nanostructures on Si(001)

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