Stigmatic imaging of secondary ions in MeV-SIMS spectrometry by linear Time-of-Flight mass spectrometer and the TimePix detector-Reference-Cited by-同舟云学术

Stigmatic imaging of secondary ions in MeV-SIMS spectrometry by linear Time-of-Flight mass spectrometer and the TimePix detector

Published:2019-08 Issue: Volume:452 Page:1-6
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Jenčič Boštjan,Šepec Luka,Vavpetič Primož,Kelemen Mitja,Rupnik Zdravko,Vencelj Matjaž,Vogel-Mikuš Katarina,Ogrinc Potočnik Nina,Ellis Shane R.,Heeren Ron M.A.,Pelicon Primož

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

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