AMS method for depth profiling of trace elements concentration in materials – Construction and applications
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference14 articles.
1. The Atomika SIMS 4000: a new dual-beam ion microprobe for spatially resolved depth profiling;Wittmaack,1992
2. Measurement of carrier-free 10Be samples with AMS: the method and its potential
3. Quantitative AMS depth profiling of the hydrogen isotopes collected in graphite divertor and wall tiles of the tokamak ASDEX-Upgrade
4. Tritium Depth Profiling by AMS in Carbon Samples from Fusion Experiments
5. Hydrogen isotope depth profiling in carbon samples from the erosion dominated inner vessel walls of JET
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1. Hydrogen isotope ratio measurement by AMS at CIAE;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2022-11
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3. 3H and 14C measurements of the irradiated graphite from the decommissioned VVR-S reactor in NIPNE Bucharest;Journal of Analytical Atomic Spectrometry;2018
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