Fast and non-destructive determination of active-layer thickness of LR 115 SSNTD using a color commercial document scanner
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference5 articles.
1. Etched track radiometers in radon measurements: a review
2. Effects of stirring on the bulk etch rate of LR 115 detector
3. Bulk etching rate of LR115 detectors
4. A fast method to measure the thickness of removed layer from etching of SSNTD based on EDXRF
5. Non-destructive measurement of active-layer thickness of LR 115 SSNTD
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1. Track counting and thickness measurement of LR115 radon detectors using a commercial image scanner;Radiation Protection Dosimetry;2013-12-09
2. Retrospective radon progeny measurements for dwellings based on implanted activities in glass objects;Radiation Measurements;2008-08
3. Equilibrium factor determination using SSNTDs;Radiation Measurements;2008-08
4. Sensitivity of LR 115 SSNTD in a diffusion chamber;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-10
5. Long-term measurements of equilibrium factor with electrochemically etched CR-39 SSNTD;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-10
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