Author:
Ichihara Chikara,Kobayashi Akira,Inoue Ken-ichi,Kimura Kenji
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Oxygen depth profiling with subnanometre depth resolution;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2014-10
2. Depth profile analysis of helium in silicon with high-resolution elastic recoil detection analysis;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2010-05
3. Theoretical analysis of mass and depth resolutions of cyclotron Rutherford backscattering spectrometry system;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-12
4. Erratum to “A new spectrometer for Rutherford backscattering spectrometry” [Nucl. Instr. and Meth. B 229 (2005) 527];Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-09
5. Advanced ion energy loss models: Applications to subnanometric resolution elemental depth profiling;Surface Science;2007-12