Particulate characterization by PIXE multivariate spectral analysis-Reference-Cited by-同舟云学术

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Particulate characterization by PIXE multivariate spectral analysis

Published:2007-08 Issue:1-2 Volume:261 Page:470-474
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Antolak Arlyn J.,Morse Daniel H.,Grant Patrick G.,Kotula Paul G.,Doyle Barney L.,Richardson Charles B.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference8 articles.

1. Automated Analysis of SEM X-Ray Spectral Images: A Powerful New Microanalysis Tool

2. Microanalytical Imaging with Auger Electrons

3. Multi-Spectral imaging in materials microanalysis

4. PIXE-quantified AXSIA: Elemental mapping by multivariate spectral analysis

5. M.R. Keenan, P.G. Kotula, US Patent 6,584,413, June 24, 2003.

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Multivariate analysis of PIXE + XRF and PIXE spectral images;Journal of Analytical Atomic Spectrometry;2021

2. Atomic spectrometry update. Environmental analysis;Journal of Analytical Atomic Spectrometry;2009

3. X-ray Spectrometry;Analytical Chemistry;2008-05-24

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