Subject
Instrumentation,Nuclear and High Energy Physics
Reference13 articles.
1. Elemental thin film depth profiles by ion beam analysis using simulated annealing – a new tool;Jeynes;J. Phys. D: Appl. Phys.,2003
2. Determination of non-Rutherford cross-sections from simple RBS spectra using Bayesian inference data analysis;Barradas;Nucl. Instrum. Methods Phys. Res. B,2008
3. Indirect method to measure differential cross-sections for nuclear reaction analysis;Nathanael;Nucl. Instrum. Methods Phys. Res. B,2015
4. SimNRA User’s Guide IPP Report Number: IPP 9/113;Mayer,1997
5. J.F. Ziegler, J.P. Biersack, M.D. Ziegler, SRIM – The Stopping and Range of Ions in Matter, Chester, 2008.
Cited by
10 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献