Depth profiles of the Doppler-broadening S parameter for polymers obtained with two measuring patterns: The role of accumulated charges
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference17 articles.
1. Damage-depth profiling of an ion-irradiated polymer by monoenergetic positron beams
2. High sensitivity of positron annihilation to thermal oxidation of polyethylene
3. Free-volume hole properties near the surface of polymers obtained from slow positron annihilation spectroscopy
4. Depth-dependent positronium formation in γ-irradiated polymers after 30-month aging
5. Damage profile of ion-implanted polycarbonate studied using a variable-energy positron beam
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1. Depth profiling and morphological characterization of AlN thin films deposited on Si substrates using a reactive sputter magnetron;The European Physical Journal Applied Physics;2014-08
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