Improving depth resolutions in positron beam spectroscopy by concurrent ion-beam sputtering-Reference-Cited by-同舟云学术

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Improving depth resolutions in positron beam spectroscopy by concurrent ion-beam sputtering

Published:2018-05 Issue: Volume:423 Page:62-66
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

John Marco,Dalla Ayham,Ibrahim Alaa M.,Anwand Wolfgang,Wagner Andreas,Böttger Roman,Krause-Rehberg Reinhard

Funder

BMBF

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference12 articles.

1. The penetration of electrons into solids. 1. The intensity of an electron beam, transverse paths of electrons;Makhov;Soviet Phys.-Solid State,1961

2. Profiling multilayer structures with monoenergetic positrons;Vehanen;Phys. Rev. B,1987

3. Defektcharakterisierung in Halbleiterschichten mit Hilfe der Positronenannihilation;Börner,2000

4. Ion source design for industrial applications;Kaufman,1982

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of the positron implantation profile on the study of the defect depth distribution by the positron annihilation technique;Journal of Applied Physics;2023-02-06

2. Metal oxide double layer capacitors by electrophoretic deposition of metal oxides. Fabrication, electrical characterization and defect analysis using positron annihilation spectroscopy;Journal of Materials Chemistry C;2018

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